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X-ray Microscopy

By: (Author) Chris Jacobsen

Extended Catalogue

Ksh 23,050.00

Format: Hardback or Cased Book

ISBN-10: 1107076579

ISBN-13: 9781107076570

Series: Advances in Microscopy and Microanalysis

Publisher: Cambridge University Press

Imprint: Cambridge University Press

Country of Manufacture: US

Country of Publication: GB

Publication Date: Dec 19th, 2019

Print length: 587 Pages

Weight: 135 grams

Dimensions (height x width x thickness): 25.40 x 18.30 x 2.70 cms

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A complete introduction to X-ray microscopy, written by a pioneer in the field. Covering optics, 3D and chemical imaging, lensless imaging, and applications, it provides the technical background needed to use, understand and develop X-ray microscopes. Ideal for academics and practitioners across engineering, and the physical and life sciences.
Written by a pioneer in the field, this text provides a complete introduction to X-ray microscopy, providing all of the technical background required to use, understand and even develop X-ray microscopes. Starting from the basics of X-ray physics and focusing optics, it goes on to cover imaging theory, tomography, chemical and elemental analysis, lensless imaging, computational methods, instrumentation, radiation damage, and cryomicroscopy, and includes a survey of recent scientific applications. Designed as a ''one-stop'' text, it provides a unified notation, and shows how computational methods in different areas are linked with one another. Including numerous derivations, and illustrated with dozens of examples throughout, this is an essential text for academics and practitioners across engineering, the physical sciences and the life sciences who use X-ray microscopy to analyze their specimens, as well as those taking courses in X-ray microscopy.

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