Examines the interference involved with instruments that employ electronic techniques to measure physical quantities, including random fluctuations from thermal sources and systematic signal drift. This book analyzes 1/f as well as white noise. It discusses baseline correction, multiple time averaging, and phase-sensitive detection.
Covering all aspects of the subject, Signal Recovery from Noise in Electronic Instrumentation, Second Edition examines the interference involved with instruments that employ electronic techniques to measure physical quantities, including random fluctuations from thermal or background sources and systematic signal drift or offset. In the case of random noise, the book fully analyzes 1/f as well as white noise. It also discusses the theory and practice of baseline correction, low-pass filtering, multiple time averaging, and phase-sensitive detection. The author explores the best way of measuring the amplitude or the time of occurrence of a signal of known shape. New to this edition are an additional chapter, frequency measurement, and tutorial questions with answers to test understanding of the subject matter. This book will be indispensable to advanced electronics undergraduates, nonspecialist postgraduates using electronic instrumentation, and applied scientists.
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