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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

By: (Author) Zhong Lin Wang

Manufacture on Demand

Ksh 22,700.00

Format: Hardback or Cased Book

ISBN-10: 0521482666

ISBN-13: 9780521482660

Publisher: Cambridge University Press

Imprint: Cambridge University Press

Country of Manufacture: GB

Country of Publication: GB

Publication Date: May 23rd, 1996

Print length: 458 Pages

Weight: 1,097 grams

Dimensions (height x width x thickness): 24.40 x 17.00 x 2.50 cms

Product Classification: Electricity, electromagnetism & magnetism
Materials science

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Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.

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