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Measurement Techniques for Radio Frequency Nanoelectronics

By: (Author) Pavel Kabos , (Author) T. Mitch Wallis

Extended Catalogue

Ksh 22,150.00

Format: Hardback or Cased Book

ISBN-10: 1107120683

ISBN-13: 9781107120686

Series: The Cambridge RF and Microwave Engineering Series

Publisher: Cambridge University Press

Imprint: Cambridge University Press

Country of Manufacture: US

Country of Publication: GB

Publication Date: Sep 14th, 2017

Print length: 328 Pages

Weight: 790 grams

Dimensions (height x width x thickness): 25.30 x 17.80 x 1.80 cms

Product Classification: Microwave technology

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Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

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