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Handbook of Charged Particle Optics

By: (Edited by) Jon Orloff

Manufacture on Demand

Ksh 34,200.00

Format: Hardback or Cased Book

ISBN-10: 1420045547

ISBN-13: 9781420045543

Edition Number: 2

Publisher: Taylor & Francis Inc

Imprint: CRC Press Inc

Country of Manufacture: US

Country of Publication: GB

Publication Date: Oct 24th, 2008

Print length: 686 Pages

Weight: 1,386 grams

Dimensions (height x width x thickness): 25.00 x 18.70 x 3.80 cms

Product Classification: Precision instruments manufacture

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A guide to understanding, designing, and using high resolution probe instrumentation. It offers information for the design and operation of high resolution focused probe instruments. It features chapters on aberration correction and applications of gas phase field ionization sources.

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.

The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work.

Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.


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