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Defects in Self-Catalysed III-V Nanowires - 2022 ed.

By: (Author) James A. Gott

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Ksh 25,200.00

Format: Paperback / Softback

ISBN-10: 3030940640

ISBN-13: 9783030940645

Edition: 2022 ed.

Series: Springer Theses

Publisher: Springer Nature Switzerland AG

Imprint: Springer Nature Switzerland AG

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Jan 31st, 2023

Print length: 143 Pages

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It is found that a surprising variety and quantity of defect structures can exist in nanowire systems, and that they can in fact host some never-before-seen defect configurations. This allowed the examination of defect formation, dynamics, and removal, revealing that many of the defects can in fact be eliminated.
This thesis presents an in-depth exploration of imperfections that can be found in self-catalysed III-V semiconductor nanowires. By utilising advanced electron microscopy techniques, the interface sharpness and defects at the atomic and macroscopic scale are analysed. It is found that a surprising variety and quantity of defect structures can exist in nanowire systems, and that they can in fact host some never-before-seen defect configurations. To probe how these defects are formed, conditions during nanowire growth can be emulated inside the microscope using the latest generation of in-situ heating holder. This allowed the examination of defect formation, dynamics, and removal, revealing that many of the defects can in fact be eliminated. This information is critical for attaining perfect nanowire growth. The author presents annealing strategies to improve crystal quality, and therefore device performance.

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